Boundary-scan Test Design for FPGA Chip on Board
Lei Wo-ni · Modern Radar · 2006
Boundary-scan test technology is a standard measurability design technology,and it provides method to carry out the measurement of device function,interconnection and influence to each other,and is more convenient for the measurement of complex circuits.This paper is for the study of real circuit under test of certain equipment subsystem.IEEE1149.1 standard is followed,and boundary-scan test design is carried out with integration to the BSDL document of FPGA chip,its design principle,data structure understood and grasped,and board level test interface to the ATE is realized.