An I_(DDQ) based built in concurrent test technique for interconnects
Feng Jian · Jounal of Xidian University · 2000
Concurrent testing is an advanced testing technique. This paper analyses the techniques adopted by most concurrent tests. An I DDQ based scheme has been presented for the concurrent built in self test of MCM interconnects, in contrast to the disadvantages of the existing techniques, expensive hardware, difficult operation and unsuitability for field service. The main feature of the testing technique is the use of the I DDQ current sensor to completely eliminate the need for logic gates for verification purposes and improve the system reliability.