Research on A Low Power Consumption for Random Single Input Change Test Theory
Xing Fu · Microelectronics & Computer · 2009
This paper presents a low-power test scheme for random single input change(RSIC).By adding simple control logic onOriginal linear feedback shift register(LFSR),so that the output of LFSR are modified,and RSIC test sequences can be obtained,which optimize the switching activity of circuit-under-test(CUT),and then result in decrease of test power consumption.In this paper,it is explained that theoretical bases of the generation of RSIC test sequences,study results based on CC4028 integrated circuits has been proven that Single Input Change test sequences are more effective than classical Multiple Input Change test sequences when a power test is targeted,58% of the switching activity is reduced and has no impact on the fault coverage,shows that this scheme is practicality.