An Efficient Diagnosis Algorithm for the Test of Embedded SRAM
Rui Li · 2005
This paper puts forward an self-diagnosis bit-oriented algorithm(MARCH-TB+), according to the testing algorithms,we use a shared built-in-self-test structure(parallel structure) to test and diagnose embedded SRAM(2k×1). The experimental results show that the proposed testing algorithm has high fault coverage, strong diagnostic ability and requires less testing time.