Circuit design of integrated probe for gear measuring
LI Shao-kan · Electronic Design Engineering · 2014
In order to reduce the noise of the probe, improve measurement precision and enhance its flexibility, the integration of scanning probe using linear variable differential inductance is researched. The sensor and the signal processing circuit are integrated in the probe with display function and standard serial communication interface. The design and development of the related circuit is discussed in this paper. One-chip solution, AD698, is utilized in the signal conditioning circuit while the subsequent processing circuit is based on a SOC MCU C8051F060 with high speed and high precision A/D converter and other functional modules. The circuit is characterized by linearity and noise and the results show that it has the desired effect.