Software-Based Self-Testing Methodology for Embedded Processor Cores
Yihe Sun · Microprocessors · 2011
In contrast with stronger ASIC function and cheaper production cost,test cost is on the increase.Traditional test technique doesn't meet the test request of high speed and multi clock SOC.It is inevitable to develop new test technique and reduce test cost.This paper presents a Soft-Based Self-Testing(SBST) method,it uses the embedded processor core of the Device-Under-Test(DUT),completes the self diagnose of chip by executing test program.This method can apply at-speed test while alleviating the need for high-speed testers.It can be applied in test process for low resolution fault location.Finally,the SBST method demonstrates successful application to an audio SOC.