Test Technology for Hidden Security Troubles in IC
Hongwei Luo · Semiconductor Technology · 2007
IC is the basis of modern information industry,and the security of information industry depends on the security of IC.The lacks of consideration or uncontrollable bad ware put in the design are the big challenges for the security of information industry.By analyzing the security leaks of the IC chips,three methods of hidden security troubles in IC were analyzed and the related test technologies were pointed out:physical test,electronic test and protocol testing.Physical test combing with electronic test inspecting the IC hidden security troubles effectively,and the electrical test technology based on the current was discussed.