Test Structure Design of "Longtium" S2 Micro-Processor
Deli Wang · Microelectronics & Computer · 2010
This paper presents the test architecture of Longtium S2 micro-processor,adopted full scan test,Built-In Self Test(BIST) etc.Design For Test(DFT).The processor is full compatible with PC104,In our design,all registers was structured by full scan,all memories were applied with BIST,whole design used JTAG for test interface.All those made faults coverage of the chip to come to 100%.