ATPG for Digital Circuits with Memory Chips
JU Yan-qiu · Jisuanji gongcheng · 2007
Two new structural models of ROM and RAM for testing are given,which can be used as testing primitives in the digital automatic test pattern generation(ATPG) systems.Test patterns for circuits with ROM chips are generated automatically after ROM’s converting to a combinational model,while the ATPG problems for circuits with RAM chips are also resolved after RAM is equivalent to a sequential model.