The Research for DFT and Verification Key Technique of SoC
XU Jian-fen · Keisou gijutsu · 2010
Very Deep Submicron(VDSM) technique and the design based on the core bring some new problems.For example,it is difficult to test and verify the SoC.In this paper,the design characteristic of the SoC,kinds of Design for Testability(DFT) and Test Access Mechanism(TAM) are summarized.Besides,the characteristic of verification for Application Specific Integrated Circuit(ASIC) and some techniques which can improve the verification for SoC,such as block level verification,assertion and form verification,Farm,are also discussed.