Sequential Circuits Test Generation Algorithm Based On Decomposition Equivalence
Ping-Ping Qu · 2007
With the growth in complexity of integration circuits,test generation for them is becoming increasingly difficult and time consuming. In this paper,a sequential circuits test generation algorithm based on decomposition equivalence is proposed. It uses the method of decomposition equivalence to avoid to get into the solution space of test codes which has been reached,reducing the research space of test codes and improving test generation efficiency. The experimental results on ISCAS'89 international standard circuits demonstrate the feasibility of this algorithm.