Improved Circuit Design of BIST Based on STUMPS
Xinwu Chen · Science Technology and Engineering · 2007
Conventional STUMPS structure spends much time for testing, but its fault coverage isn’t high enough. To reduce the testing time, a modified structure which tests the CUT with test-per-clock and test-vector compression is proposed. To improve the fault coverage, storage-mode is added to LFSR-mode. Experiments on ISCAS'85 Benchmark circuits show that the scheme is satisfied.