Research of Intelligent Comprehensive Electronic Tester Based on the Platform of ARM
Lai Shu-ming · Microcomputer Information · 2008
The paper presents the design and implementation ideas of a intelligent comprehensive electronic tester. The scheme is based on ARM and FPGA with high speed AD and DA , in which the high speed data acquisition and data process can be imple- mented effective and man-machine interaction can be achieved. The experiment showed the design was feasible.