Image quality metrics applied to digital pathology
Ana Jiménez, Gloria Bueno, Gabriel Cristóbal, Óscar Déniz, David Toomey, Catherine M. Conway · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2016
Several full-reference and blind metrics from literature have been tested on a set of digitized pathology slides under different known distortion conditions. Those ones showing the most uniform behavior are presented in this paper. Also, an algorithm that provides a blur map of the whole slide images (WSIs) has been implemented based on one of such methods.