Multidimensional characterization of an entangled photon-pair source via stimulated emission tomography
Bin Fang, Marco Liscidini, John E. Sipe, Virginia O. Lorenz · Optics Express · 2016
Using stimulated emission tomography, we characterize an entangled photon-pair source in the energy and polarization degrees of freedom, with a precision far exceeding what could be obtained by quantum state tomography. Through this multidimensional tomography we find that energy-polarization correlations are a cause of polarization-entanglement degradation, demonstrating that this technique provides useful information for source engineering and can accelerate the development of quantum information processing systems dependent on many degrees of freedom.