Using the 0‐1 test for chaos to detect hardware trojans in chaotic bit generators
Michał Melosik, Wiesław Marszałek · Electronics Letters · 2016
The use of the 0‐1 test for chaos to monitor chaotic bit generators susceptible to unauthorised changes and modifications of the circuits’ parameters (hardware trojans) is presented. The 0‐1 test proves that the chaotic nature of the continuous time signals is inherited by the bit sequences even when a simple threshold comparator is used. Simulation results with the Chua and Lindberg–Murali–Tamasevicius circuits are presented.