Advance in the Analysis Models for Characterizing Multi-Layered Interdigital Capacitors
Kwong Wai Mak, Jianhua Hao · International Journal of Advanced Applied Physics Research · 2014
The performances of multi-layered interdigital capacitors are commonly simulated by computer software. However, it is the time-consuming process. Besides simulations, the analytic models with closed form expressions provide convenient methods in particular usages, such as characterizing ferroelectric materials. This article briefly reviews the development in the expressions for analytic models. We provide an overview of partial capacitance technique and conformal mapping technique, which are used for formulating expressions. In addition, three common models used these techniques are presented. The differences of models and applications are also discussed.