Fundamental Study on a Mechanism of Faulty Outputs from Cryptographic Modules due to IEMI
Yu‐ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone · IEEJ Transactions on Fundamentals and Materials · 2015
This paper investigates a mechanism of faulty outputs from cryptographic modules due to intentional electromagnetic interference (IEMI) which causes information leakage in electric devices without disrupting their functions or damaging their components. We show the mechanism of fault occurrence through experiments using the faulty ciphertexts and the pulse injection to the specific round. The experimental results indicate that faulty outputs from cryptographic modules are caused by setup-time violation to the cryptographic module.