Memory less Rotation Based BIST with Low Area Overhead
J U Drusya, Srikanth Venkateswaran · IOSR Journal of VLSI and Signal processing · 2014
BIST is an efficient method for testing the circuits, area overhead is the main problem associated with BIST.Here we presents a deterministic BIST technique with low area overhead and that can provide complete fault coverage without using any storage devices.The test structure containing a circular shift register with some feedback from the CUT as its input, which provide all the required test patterns.It can provide 100% fault coverage for all testable stuck-at faults.