Local Quantity Analysis of Nanosize Electronics and Spintronics Material
Masato Senami, Akitomo Tachibana · ECS Transactions · 2013
New analysis method using novel local quantities is introduced for the purpose of the analysis of nanosize materials in microscopic viewpoints. The importance and availability of these quantities are discussed for particularly two types of quantities. First one is the polarizability and dielectric constant density tensors. By these quantities, the linear response to the electric field is investigated in atomic viewpoints. This approach is suitable for the analysis of nanomaterials, such as high-k thin film, particularly, in viewpoints of the study of the effects of defects and interfaces. Second one is the spin toque and the zeta force. These quantities clarify the local dynamics of the electron spin. Hence, this quantity is useful for a field of spintronics.