Research and design of an examination handset based on RFID
Xun Zhang, Xiqing Wang, Fen Fen Yu, Lingling Sun · China-Ireland International Conference on Information and Communications Technologies (CIICT 2008) · 2008
This paper presents an innovative examination handset based on RFID, through which the usual examination will be implemented with great efficiency, and the test paper, the examinee can be well traced in a non-contact way. Its innovation focuses on that it can identify a certain amount of tags simultaneously by its anti-collision mechanism, which will ameliorate the managements of all kinds of examinations to check identity of examinee, count test papers, manage examination certificate or testamur and so on. So it will help to avoid the crowded queue in examination room. In this paper the hardware and software design of this examination handset is also described, which is realized with S3C2410 processor and ADF7020 RFIC.