Programmable RF Built-In Self-Test Circuit for 5GHz Wireless LAN
Woo-Chang Choi, Jee-Youl Ryu, Sookyoung Joung · International Journal of Smart Home · 2013
This paper proposes a new programmable RF Built-In Self-Test (BIST) circuit for 5GHz Wireless LAN. It is fabricated using 0.18-µm SiGe technology. This circuit is useful for testability of GHz-band RF IC devices in a complete RF transceiver environment. The proposed circuit helps it to provide DC output voltages and accurate phase difference. It contains two peak detectors and a phase detector. The proposed circuit showed excellent performance.