Progress in Measurement with Picometer Resolution and Subdivision Technique
汤善治 TANG Shan-zhi, 王昭 Wang Zhao, 蒋志雄 JIANG Zhi-xiong, 郭俊杰 GUO Jun-jie · ACTA PHOTONICA SINICA · 2010
The domestic and foreign progress of picometer resolution measurements were reviewed.Typtical methods for measurement with high resolution(picometer resolution) were introduced,and the progress of picometer measurements was presented.The principles and corresponding subdivision techiniques were studied.Then,two novel measurements were proposed and analyzed.The multiple reflection interferometer was analyzed.It has the advantages of higher resoultion and more simplicity deivce than X-ray interferometer,which provide a good future in the fields of spectroscopy and high-precision measurement.