Approaches of error diagnosis and correction in combinational circuits
Li Xing, Yan Xiao-lang, GE Hai-tong · 2003
With the increase in the complexity of VLSI circuit design and corresponding increase in the number of logic gates on a chip, logic design errors can frequently occur. In this paper we review two representative approaches for error diagnosis and correction. They are simulation-based approach and symbolic approach. The basic ideas are presented. The two approaches are compared and the advantages and disadvantages are presented.