Derivation of accurate structure factors from intensities
A. McL Mathieson · Acta Crystallographica Section A Foundations of Crystallography · 1984
Currently the most widely used rorm of sort x-ray microscopy is one which does not employ x-ray optics, but records a 1:1 contact image of the specimen, using soft x-rays and an ultra Imv-grain recording medium.(See R.Feder et al., in: X-Ray Nicroscopy, Springer-Verlag, 1984.)The contact image is then examined by electron microscopy.Resolution is limited primarily by diffraction blurring, and varies from 50 to several hundred Angstroms, depending on wavelength and specimen thickness.The technique is convenient, permi-ts stereo, flash, and multiple-wavelength imaging, and can be used for the imaging of wet and/or living material.Examples will be shmm, and future prospects for the technique will be discussed.