Novel Core Test Wrapper Design Supporting Multi-mode Testing of NoC-based SoC
Ying Zhang, Ning Wu, Fen Ge, Chen Xin · International Journal of Control and Automation · 2013
According to embedded IP core structure and various DFT strategies, it is difficult to test NoC-based SoC especially for reuse situation. The paper proposes the design of a compatible IEEE 1500 standard core test wrapper, which makes different IP cores homogeneous from the point of test integration. A test response comparator is added to the test wrapper, which is capable of verifying directly whether there is failure in this IP. The comparator not only improves testing efficiency and also supports various test modes. The function and timing simulation of proposed wrapper are accomplished on ISCAS '89 circuits. A 2D Mesh NoC was constructed based on these wrappered IP cores and implemented unicast and multicast testing. The experimental results show that the wrapper can effectively realize embedded IP test access and isolation, and has the good adaptability to support various NoC test strategies.