Analyzing of Pseudo-Ring Memory Self- Testing Schemes with Algorithms
Ghenadie Bodean · International Journal of Distributed and Parallel systems · 2012
In this paper, scan and ring schemes of the pseudo-ring memory self-testing are investigated.Both schemes are based on emulation of the linear or nonlinear feedback shift register by memory itself.Peculiarities of the pseudo-ring schemes implementation for multi-port and embedded memories, and for register file are described.It is shown that only small additional logic is required and allows microcontrollers at-speed testing.Moreover, posteriori values are given for some types of memories faults coverage when pseudo-ring testing schemes are applied.