On‐Chip Generating FPGA Test Configuration Bitstreams to Reduce Manufacturing Test Time
Fei Wang, Da Wang, Haigang Yang, Xianghui Xie, Dongrui Fan · Chinese Journal of Electronics · 2016
Statistics shows that over 95% of FPGA manufacturing test time is spent on loading test configuration bitstreams. Reducing the test time that spent on loading test configuration bitstreams could significantly reduce FPGA test time. A new approach which can significantly reduce the FPGA test time is presented. Experimental results show that the proposed technique can at least reduce the configuration loading time by 96%, while getting 100% test coverage with less than 1.2% hardware overhead.