Mapping Quantum Efficiency Measurements: a Tool for Large Area Module Optimization
Paolo A. Losio, O. Caglar, H. Knauss, Juergen Sutterlueti, O. Kluth · EU PVSEC · 2009
Large area (1.4 m2) thin film photovoltaic modules require precise control of the deposition uniformity. Most metrology tools focus either on the spatially resolved measurement of single layers or on the measurement of the performance of a module as a whole. We present a new tool to map the quantum efficiency of a module. Mapping quantum efficiency measurements of large area modules combines the well known functionality of quantum efficiency measurements with spatially resolved information. This unique combination enables in-depth optimization of both a-Si:H and tandem a-Si:H/μc-Si modules. This paper shows examples of the application of mapping QE measurements at OC Oerlikon Solar.