An Object-Oriented Redundant Fault Detection Scheme for Efficient Current Testing
Sung-Hwan Bae, Kwan-Woong Kim, Byoung-Sil Chon · 2002
Current testing(Iddq testing) on monitoring the quiescent power supply current is an efficient and effective method for CMOS bridging faults. The applicability of this technique, however, requires careful examination. Since cardinality of bridging fault is O() and current testing requires much longer testing time than voltage testing, it is important to note that a bridging fault is untestable if the two bridged nodes have the same logic values at all times. Such faults should be identified by a good ATPG tool; otherwise, the fault coverage can become skewed. In this paper, we present an object-oriented redundant fault detection scheme for efficient current testing. Experimental results for ISCAS benchmark circuits show that the improved method is more effective than the previous ones.