Thermal resistance measurement of discrete capacitors
Zoltán Sárkány, Gábor Farkas, M. Rencz · 2015
Not only the active devices are affected by the generated power in electronics but capacitors also suffer from the elevated temperature levels. This paper attempts transferring the concepts of the thermal transient measurement method used in the semiconductor characterization to capacitor components. We show how temperature dependent electrical parameters could be used to measure the temperature of capacitors and also discuss the key requirements against the measurement setup.