A scan segment skip technique for low power test
Hayoung Lee, Junkyu Lee, Hyunyul Lim, Sungho Kang · 2015
Excessive power consumption during testing has been one of the most important issues from the exponential advance in semiconductor manufacturing technology. In this paper, a scan segment skip technique is proposed to reduce power consumption by skipping segments that don't need scan in/out processes. Also, a new pattern merge algorithm is proposed for maximizing power reduction ratio. Experimental results show that the proposed technique efficiently reduces test power consumption with the minimal impact on area overhead.