Fault characterization and testing of digital current mode logic circuits
Vikram Devdas · cIRcle (University of British Columbia) · 2009
The research reported in this dissertation describes a new approach to test differential current- mode logic (CML) circuits. The tests described in this thesis have been developed for high-speed digital interface circuits, such as multiplexors and demultiplexers, used in the telecom/ datacom industry. However, these tests are generic, and can be applied to any kind of current-mode logic circuit. To the authors' best knowledge, the test algorithms described in this thesis have not been previously proposed or used in the area of differential CML integrated circuit testing. The fault simulation and fault grading results show that the proposed test methodology is able to achieve a very high fault coverage and thereby exhibits an attractive and cost effective solution for CML testing.