Channel Models for Multi-Level Cell Flash Memories Based on Empirical Error Analysis
Veeresh Taranalli, Hironori Uchikawa, Paul H. Siegel · IEEE Transactions on Communications · 2016
We propose binary discrete parametric channel models for multi-level cell (MLC) flash memories that provide accurate error-correcting code (ECC) performance estimation by modeling the empirically observed error characteristics under program/erase cycling stress. Through a detailed empirical error characterization of 1X-nm and 2Y-nm MLC flash memory chips from two different vendors, we observe and characterize the overdispersion phenomenon in the number of bit errors per ECC frame. A well-studied channel model, such as the binary asymmetric channel model, is unable to provide accurate ECC performance estimation. Hence, we propose a channel model based on the beta-binomial probability distribution [2-beta-binomial (2-BBM) channel model], which is a good fit for the overdispersed empirical error characteristics, and show through statistical tests and simulation results for BCH, low density parity check, and polar codes, that the 2-BBM channel model provides accurate ECC performance estimation in MLC flash memories.