A New Frequency-domain Analog Test Generation Tool
Érika Cota, Marcelo Soares Lubaszewski, Elias José Di Domênico · 1997
This paper presents a sensitivity-based test generation tool for analog multifrequency testing. This tool generates minimal test sets that maximize the coverage of soft, large and hard component faults and enhance the coverage of interconnect shorts. The test generation procedure is illustrated for a low-pass biquad filter. This procedure is now being automated by integrating commercially available tools for symbolic computation and electrical simulation.