A Hardware Consideration of CALBO Testing
SL Hurst · 1989
The use of BILBO (Built-in Logic Block Observation) for on-chip test of VLSI digital circuits has been extensively considered in recent years, as a means to tackle the problem of VLSI testing without the need for expensive off-line test equipment. A recent development has been CALBO (Cellular Automaton Logic Block Observation), which addresses exactly the same area as BILBO, but does not employ a pseudorandom linear-feedback shift-register (LFSR) as the test-vector source and as the test-signature accumulator when in test mode. Instead a one-dimensional cellular automaton confirmation is suggested. In this paper we will first define the CALBO test configurations, and then consider the silicon area requirements of CALBO in comparison with previous BILBO developments.