Dynamic Fault Tree Analysis for Explosive Logic Network with Two-Input-One-Output
黄承赓, 李彦锋, 李姝颖, 李海庆 · 东华大学学报：英文版 · 2015
The explosive logic network( ELN) with two-input-oneoutput was designed with three explosive logic gap null gates. The time window of the output of the ELN was given,after which the dynamic fault tree analysis was implemented. Two dynamic failure modes of the ELN were obtained,and then their own Markov transition processes were established. After that,the probability of failure was calculated from the corresponding state transition diagram. The reliability of the ELN which was in different length of time under the ambient incentive was then analyzed. Based on the above processing,the reliability of the ELN can be improved.