Full-response characterization of afterpulsing in single-photon detectors
D. B. Horoshko, Viacheslav N. Chizhevsky, S. Ya. Kilin · arXiv (Cornell University) · 2014
We have performed a statistical characterization of the effect of afterpulsing in a free-running silicon single-photon detector by measuring the distribution of afterpulse waiting times in response to pulsed illumination and fitting it by a sum of exponentials. We show that a high degree of goodness of fit can be obtained for 5 exponentials, but the physical meaning of estimated characteristic times is dubious. We show that a continuous limit of the sum of exponentials with a uniform density between the limiting times gives excellent fitting results in the full range of the detector response function.