Advanced modular testing methods for integrated circuits
Benjamin Hall · ThinkTech (Texas Tech University) · 2015
The Program for Semiconductor and Product Engineering (PSPE) at Texas Tech University strives to prepare students for a job in the semiconductor field. One crucial partner with PSPE is National Instruments (NI) who has donated a state of the art Automated Test Equipment (ATE) called the Semiconductor Test System (STS). This thesis discusses the development of curriculum for ECE 5332: Advanced Modular Testing Methods for Integrated Circuits, which focuses on training students how to properly utilize the STS foe their own projects