Accurate and efficient testing of resistive bridging faults
Hugo Cheung · University of Southern California Digital Library · 2015
Many studies show that bridging defects are major causes of fabrication failures. A bridging fault causes a short circuit between circuit nodes and can be tested by logic testing, which measures the erroneous logic values at the circuit outputs, or by IDDQ testing, which measures the elevated power supply current (called IDDQ). This research spans logic as well as IDDQ testing for bridging faults.