Testing mixed signal integrated circuits
Peter R. Shepherd, Mahmoud Al‐Qutayri, P.S.A. Evans · 1990
A technique is described which can be applied to the testing of circuits containing both analogue and digital components. The approach is based on transient response techniques, and uses digital-like test vectors. The technique is compared with current testing techniques for mixed signal devices and is shown to have certain advantages over these other techniques. Experimental results based on a simple mixed signal circuit are presented, and reasonable fault coverage with minimal testing effort is demonstrated.