Local validation of sensor signals
S. K. Yung · 1993
Presents the methodology and the architecture of a novel local sensor validation scheme. It is sufficiently simple to be implemented at the sensor level and highly flexible to accommodate a wide variety of sensors and process conditions. The proposed local sensor validation scheme has the overwhelming advantage of being sensor and application independent and is therefore economical to be mass produced as 'off-the-shelf' units, either as embedded special purpose chips within smart sensors or as 'add-on' signal conditioning modules. It provides an efficient and cost-effective method to safeguard the integrity and credibility of measurement data. >