Cost-Efficient and Automatic Large Volume Data Acquisition Method for On-Chip Random Process Variation Measurement
Sooeun Lee, Seung Ho Han, Ikho Lee, Jae‐Yoon Sim, Hong-June Park, Byungsub Kim · JSTS Journal of Semiconductor Technology and Science · 2015
This paper proposes a cost-efficient and automatic method for large data acquisition from a test chip without expensive equipment to characterize random process variation in an integrated circuit. Our method requires only a test chip, a personal computer, a cheap digital-to-analog converter, a controller and multimeters, and thus large volume measurement can be performed on an office desk at low cost. To demonstrate the proposed method, we designed a test chip with a current model logic driver and an array of 128 current mirrors that mimic the random process variation of the driver