Node-wise Analysis of Puncturing Patterns for LDPC Codes over AWGN Channel
Sunghoon Choi, Jun Heo · ITC-CSCC :International Technical Conference on Circuits Systems, Computers and Communications · 2007
In this paper, we analyze the effect of puncturing patterns for rate-compatible Low-Density Parity-Check (LDPC) codes. Each punctured variable node are connected with multiple check nodes and the check nodes are categorized into two groups named as ‘survived check (SC) node’ and ‘dead check (DC) node’ according to the role of them [3]. With this categorization, we derived the node-wise error probability using density evolution and presented simulation results which were well matched with the analysis.