Measurement of {sup B(D0{yields}K-{pi}+{pi}o})/{sub B(D0{yields}K-{pi}+)}
T. Bergfeld · Bulletin of the American Physical Society · 1995
Using the 3.2fb{sup {minus}1} data set accumulated by CLEO II at the Cornell Electron Storage Ring, the authors make the most precise measurement of B(D{sup 0} {yields} K{sup {minus}}{pi}{sup +}{pi}{sup 0})/B(D{sup 0} {yields} K{sup {minus}}{pi}{sup +}) to date. Due to the high statistics available, the error on this result is dominated by the systematic uncertainty. When this measurement is combined with the CLEO II measurement of the absolute branching fraction for D{sup 0} {yields} K{sup {minus}}{pi}{sup +}, they obtain an absolute branching fraction for D{sup 0} {yields} K{sup {minus}}{pi}{sup +}{pi}{sup 0}.