Fast Hough transform analysis: pattern deviation from line segment
Egor I. Ershov, Arseniy P. Terekhin, Dmitry Nikolaev, Vladimir A. Postnikov, Simon M. Karpenko · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2015
In this paper, we analyze properties of dyadic patterns. These pattern were proposed to approximate line segments in the fast Hough transform (FHT). Initially, these patterns only had recursive computational scheme. We provide simple closed form expression for calculating point coordinates and their deviation from corresponding ideal lines.