Diagnostic of Analogue Nonlinear Circuits in dc by Using a Tearing Procedure
A. Gracibs-Marin, A. Bocanegra-Haro, Astrofisica Optica · 1997
The diagnostic of analogue circuits has sev- eral drawbacks in comparison to its counterpart digital. In particular, the diagnostic in the dc domain has two main issues: the shifting of the dc bias point and the existence of multiple dc operating solutions. This paper is focussed on the change of the number of dc operating points due to faulty elements. It determines the change on the number of dc solutions either by the presence of active or passive faulty elements. The method here de- veloped detects this change by applying a tearing procedure in order to save computing time. The circuit representa- tion yields a pair of matrices of the linear part and the nonlinear part (the BJTs) of the circuit. The structure of both matrices allows us to carry out a tearing procedure that speed up the diagnostic method. Besides, it can be easily programmed and added to a CAD frame.