The influence of material structure of thick film resistor on C-V characteristic
Ivana Beshajovii Pelikiinovii · 2001
The materials for thick film resistive layers is inhomogeneous mixture. The layer contain a particle of conductive functional component (in our case - carbonic) dissipated in insulative matrix. The current - voltage characteristic of resistors that is prepare by technology of thick film is not linear, In deviation from linearity of C-V characteristic participate so material of resistive layer as interface between contact and resistive layer. The object of work was the investigation of influence of two system (resistive layer and interface layerkontact). A question arise - what have more influence on nonlinearity? The measurement of third harmonics voltage was used for determination of nonlinearity of C-V characteristic. A direct measurement of C-V characteristic not enable to discover the small deviation from linearity of C-V characteristic. The samples were powered by pure sinusoidal signal. A pure sinusoidal signal is distorted by transit through inhomogeneity of layer and interface. For investigation were used the samples - resistors with different size (width and length). The measurement of third harmonics was performed on samples powered by signal with constant current density and constant current,