Investigation of1/fNoiseofp-typeCdTeDetectors
А. А. Андреев · 2007
This paper presents theresults ofexperimental studies oftransport andnoise characteristics ofCdTesingle crystals. Though nouniversal mechanism hasbeenidentifiedforfli cker noise orIf noise, itisthemostubiquitous formofnoise innature. Phenomena that havenoobvious connection likeheartbeat, cellmembrane potential, financial data, DNA sequences andtransistors exhibit fluctuations witha1/f character. AsthetermIfsuggests, aspectral density that increases without limit asfrequency decreases, characterizes this kindofnoise. Flicker noise intheCdTesingle crystals wasstudied. TwoCdTedetectors wereused; bothhavep-type conductivity. Oneofthemhaslow- ohmic contacts (F33B8), another onehavehigh-ohmic contact (452D).