A NEW SINGLE STUCK FAULT DETECTION ALGORITHM FOR DIGITAL CIRCUITS
Ahmed K. Jameil · 2015
This paper presents a novel single stuck fault detection algorithm for digital circuits, focusing on combinational circuits composed of AND, OR, NAND, and NOR gates. The study introduces a fault simulation method utilizing serial fault simulation and C programming to detect faults efficiently. Results highlight a fault coverage rate of 96%, validating the accuracy and reliability of the proposed approach.